作者: Dabagov Anatoly Rudolfovich , Sporysh Vladimir Igorevich , Suponnikov Dmitry Aleksandrovich , Putilin Andrey Nikolaevich
DOI:
关键词: Scintillator 、 Particle detector 、 Resolution (electron density) 、 Base (geometry) 、 Detector 、 Optics 、 Pixel 、 Layer (electronics) 、 Sensitivity (electronics) 、 Materials science
摘要: The proposed invention relates to the production of devices for detecting an image produced when recording X-radiation, in particular X-ray analysis biomaterials and biological objects as a whole, also non-destructive testing systems. An X-radiation detector consists scintillator layer on surface multi-element photosensitive sensor arranged base providing mechanical stability entire structure. layer, characteristics which differ different three-dimensional zones, both terms thickness arrangement relative pixel structure sensor, allows non-uniform sensitivity resolution. detection with differing contrast resolution using single detector.