Temperature control within storage device testing systems
作者： Brian S. Merrow
DOI:
关键词: Test algorithm 、 Electrical conduit 、 Test (assessment) 、 Electrical engineering 、 Temperature control 、 Heat exchanger 、 Airflow 、 Electronics 、 Compartment (pharmacokinetics) 、 Engineering
摘要: A storage device testing system cooling circuit includes a plurality of test racks. Each the racks include slot compartment and electronics compartment. compartments multiple slots, one or more conduits configured to convey liquid toward slots. communicate with slots for executing algorithm, heat exchanger in fluid communication conduits. The is cool an air flow directed electronics.
google.de 参考文章(384)
Tsan Jung Shen, Hard disk drive heat dissipation device ,(1999)
Mark Mesher, Diskette sequential transport apparatus ,(1983)
Cheng-Chun Chang, Replaceable hard disk drive box structure ,(1996)
Nevin A. Archibald, Tariq Iqbal, Joseph M. Viglione, Cluster-based defect detection testing for disk drives ,(2004)
Byoung-Soo Song, Method of and apparatus for cooling an operating system using the Peltier effect ,(1998)
Marvin Benjamin Davis, David Louis Schell, Apparatus and method for suppression of electromagnetic interference ,(1996)
Alpha Ngai Chung Ho, Whyemun Chan, Universal power simulator ,(1998)
Chun Hsiung Lin, Computer hard drive heat sink assembly ,(1998)
Kuang Jui Cheng, Extracting and positioning structure for hard disk drive ,(2000)
Mohanlal Savji Mansuria, Vinod Kamath, Leo H. Webster, Quick-release mechanism for hard disk drive ,(1999)