Preparation, electrical properties and annealing of ZnGeAs2

作者: B Mercey , D Chippaux , J Vizot , A Deschanvres

DOI: 10.1016/0022-3697(86)90174-5

关键词: Inorganic compoundArsenicAnnealing (metallurgy)ZincCrystal growthSingle crystalInorganic chemistrySolventAnalytical chemistryElectrical resistivity and conductivityChemistry

摘要: Abstract Crystals of ZnGeAs 2 have been grown from solution (Zn x As y solvent). Electrical properties crystals before and after annealing in arsenic or phosphorus vapors are reported. The always ( p ) type. Assuming the electrical as to be due zinc vacancies, a mechanism is given explain change free carrier concentration during annealing. A good fit obtained between observed calculated values.

参考文章(4)
U. Kaufmann, J. Schneider, A. Räuber, ESR detection of antisite lattice defects in GaP, CdSiP2, and ZnGeP2 Applied Physics Letters. ,vol. 29, pp. 312- 313 ,(1976) , 10.1063/1.89059
F.W. Scholl, E.S. Cory, Preparation and properties of ZnGeAs2 Materials Research Bulletin. ,vol. 9, pp. 1511- 1515 ,(1974) , 10.1016/0025-5408(74)90098-1
K. W. Böer, R. Boyn, O. Goede, Self‐Activated Semiconductivity in CdS Single Crystals Physica Status Solidi B-basic Solid State Physics. ,vol. 3, pp. 1684- 1694 ,(1963) , 10.1002/PSSB.19630030913
V. N. Brudnyi, A. I. Potapov, Yu. V. Rud, Electrical properties of H+‐irradiated p‐ZnGeAs2 Physica Status Solidi (a). ,vol. 75, ,(1983) , 10.1002/PSSA.2210750157