作者: A. Peyre-Lavigne , J.C. Dupre , D. Blanc , M. Petel , G. Soudain
DOI: 10.1016/0029-554X(69)90349-8
关键词: Surface barrier 、 Fabrication 、 Analytical chemistry 、 Semiconductor 、 Silicon 、 Physics 、 Optoelectronics 、 Water vapor 、 Argon
摘要: Zusammenfassung By irradiating the surface of a barrier detector with an X-ray beam (50 kV) or quasi-punctual luminous spot, short-circuit current in vacuum and different gases (argon, oxygen, air) containing variable proportions water vapor was measured. At same time relaxation associated photoresponse determined. These measurements made it possible to establish series criteria for fabrication detectors function on avalanche regime. The comparison experiment values those calculated by Cumerow's model that photopotential has furnished precise information structure p-n junction view better knowledge mechanism.