作者: CV Niveditha , MJ Jabeen Fatima , Rajita Ramanarayanan , Bhabhina Ninnora Meethal , Sindhu Swaminathan
DOI: 10.1016/J.MATPR.2018.05.142
关键词: Thin film 、 Horizontal scan rate 、 Spectroscopy 、 Scanning electron microscope 、 Supercapacitor 、 Chemical engineering 、 Hall effect 、 Materials science 、 Copper oxide 、 Raman spectroscopy
摘要: Abstract A well dispersed stable film is synthesized via potentiodynamic deposition technique under ambient conditions and neutral pH. p-type copper oxide prepared potentiodynamically a scan rate of 20 mV/s in potential sphere, which reaffirmed by virtue hall measurements. The characterization tools like Gracing Incidence X-ray diffraction, Raman spectroscopy, UV-Visble photoluminescenece Scanning Electron Microscope Hall measurement are used to study the structural, optical, morphological electrical traits thin films. Film thickness plays pivotal role supercapacitor application. amelioration for application attuned repeating number cycles such as 15, 30 45. formed displays better specific capcitance value with an excellent cyclic stability 1000 having good charge retention efficiency.