作者: Nan Yao , Anthony Y. Ku , Nobuyoshi Nakagawa , Tu Lee , Dudley A. Saville
DOI: 10.1021/CM000038A
关键词: Thin film 、 Mesoscopic physics 、 Nanotechnology 、 Nucleation 、 Transmission electron microscopy 、 Amorphous solid 、 Critical thickness 、 Scanning electron microscope 、 Condensed matter physics 、 Electron microscope 、 Materials science
摘要: Electron microscopy has been used to study the mesoscopic (nanometer-level) and microscopic (micrometer-level) structural evolution of silica thin films grown at air−water interface under dilute, acidic (pH < 2) conditions. Transmission electron microscope observations reveal that film begins with a disordered (amorphous) structure. Over time, mesoscopically ordered regions (hexagonally packed cylindrical channels) nucleate grow within film. Scanning reveals features such as ribbons, protrusions, domain boundaries, microindentations, pits. Our work shows order develops through “disorder transition.” also clarify role in confining growth two dimensions during initial stages. We note two-dimensional (in-plane) three-dimensional (unconstrained) transition occurs when exceeds critical thickness. extend th...