Disorder−Order Transition in Mesoscopic Silica Thin Films

作者: Nan Yao , Anthony Y. Ku , Nobuyoshi Nakagawa , Tu Lee , Dudley A. Saville

DOI: 10.1021/CM000038A

关键词: Thin filmMesoscopic physicsNanotechnologyNucleationTransmission electron microscopyAmorphous solidCritical thicknessScanning electron microscopeCondensed matter physicsElectron microscopeMaterials science

摘要: Electron microscopy has been used to study the mesoscopic (nanometer-level) and microscopic (micrometer-level) structural evolution of silica thin films grown at air−water interface under dilute, acidic (pH < 2) conditions. Transmission electron microscope observations reveal that film begins with a disordered (amorphous) structure. Over time, mesoscopically ordered regions (hexagonally packed cylindrical channels) nucleate grow within film. Scanning reveals features such as ribbons, protrusions, domain boundaries, microindentations, pits. Our work shows order develops through “disorder transition.” also clarify role in confining growth two dimensions during initial stages. We note two-dimensional (in-plane) three-dimensional (unconstrained) transition occurs when exceeds critical thickness. extend th...

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