Practical electron tomography guide: Recent progress and future opportunities
作者： Misa Hayashida , Marek Malac
DOI: 10.1016/J.MICRON.2016.09.010
关键词: Volume reconstruction 、 Medical physics 、 Electron tomography 、 Materials science 、 Systems engineering
摘要: We present a review of the recent progress in electron tomography applicable to materials science samples. focus on practical high accuracy tomographic measurements and their applications. follow steps leading reconstructed 3D volume discuss effect individual suitability resulting for quantitative measurements. Both applications new opportunities are reviewed.
sci-hub.se 参考文章(182)
David N. Mastronarde, Fiducial Marker and Hybrid Alignment Methods for Single- and Double-axis Tomography Springer, New York, NY. pp. 163- 185 ,(2007) , 10.1007/978-0-387-69008-7_6
Fernando Amat, Daniel Castaño-Diez, Albert Lawrence, Farshid Moussavi, Hanspeter Winkler, Mark Horowitz, Alignment of cryo-electron tomography datasets. Methods in Enzymology. ,vol. 482, pp. 343- 367 ,(2010) , 10.1016/S0076-6879(10)82014-2
J. Frank, Three-dimensional electron microscopy of macromolecular assemblies : visualization of biological molecules in their native state Oxford University Press. ,(2005)
John Meurig Thomas, Rowan K. Leary, Alexander S. Eggeman, Paul A. Midgley, The rapidly changing face of electron microscopy Chemical Physics Letters. ,vol. 631, pp. 103- 113 ,(2015) , 10.1016/J.CPLETT.2015.04.048
Toshio Moriya, Erman Acar, R. Holland Cheng, Ulla Ruotsalainen, A Bayesian approach for suppression of limited angular sampling artifacts in single particle 3D reconstruction Journal of Structural Biology. ,vol. 191, pp. 318- 331 ,(2015) , 10.1016/J.JSB.2015.07.007
Bart Goris, Jan De Beenhouwer, Annick De Backer, Daniele Zanaga, K. Joost Batenburg, Ana Sánchez-Iglesias, Luis M. Liz-Marzán, Sandra Van Aert, Sara Bals, Jan Sijbers, Gustaaf Van Tendeloo, Measuring Lattice Strain in Three Dimensions through Electron Microscopy Nano Letters. ,vol. 15, pp. 6996- 7001 ,(2015) , 10.1021/ACS.NANOLETT.5B03008
Peter W. Hawkes, The Electron Microscope as a Structure Projector Springer, New York, NY. pp. 83- 111 ,(2007) , 10.1007/978-0-387-69008-7_4
Lewys Jones, Hao Yang, Timothy J. Pennycook, Matthew S. J. Marshall, Sandra Van Aert, Nigel D. Browning, Martin R. Castell, Peter D. Nellist, Smart Align—a new tool for robust non-rigid registration of scanning microscope data Advanced Structural and Chemical Imaging. ,vol. 1, pp. 8- ,(2015) , 10.1186/S40679-015-0008-4
H. Kohl, Ludwig Reimer, Transmission Electron Microscopy ,(2009)
Misa Hayashida, Kazuhiro Kumagai, Marek Malac, Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography Micron. ,vol. 79, pp. 53- 58 ,(2015) , 10.1016/J.MICRON.2015.08.003