Structural and Electronic Properties of PTCDA Thin Films on Epitaxial Graphene

作者: Han Huang , Shi Chen , Xingyu Gao , Wei Chen , Andrew Thye Shen Wee

DOI: 10.1021/NN9008615

关键词: Thin filmScanning tunneling microscopeSilicon carbideWide-bandgap semiconductorLayer (electronics)SynchrotronMonolayerPhotoemission spectroscopyMaterials scienceOptoelectronicsCrystallography

摘要: … The PTCDA films grow continuously over the EG step edges, but not on HOPG. … PTCDA on monolayer EG shows a wide band gap larger than 3.3 eV, consistent with pristine PTCDA …

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