作者: Lyda-Vanessa Herrera-Sepulveda , Jose-Luis Olvera-Cervantes , Alonso Corona-Chavez , Tejinder Kaur
DOI: 10.1109/LMWC.2019.2928295
关键词: Optoelectronics 、 Microstrip 、 Resonator 、 Capacitance 、 Electric coupling 、 Dielectric 、 Materials science 、 Planar
摘要: In this letter, a new sensor, theory, methodology, and experimental results of dielectric constant characterization several planar samples under test (SUT) are presented. Each SUT is placed over microstrip sensor that based on pair electrically coupled resonators (ECRs). The proposed method determines the by using electric coupling coefficient ( $k_{e}$ ) half-wavelength open-loop resonators. methodology was successfully tested wide value substrates at 2.5 GHz, with Diclad 880, Rogers 5870, 4003C, TMM10i, 6010 resulting in high-accuracy percentages 99.22%, 99.21%, 99.56%, 97.68%, 98.60%, respectively.