作者: Wolfgang Grill
DOI:
关键词: Surface structure 、 Solid medium 、 Ultrasonic sensor 、 Process (computing) 、 Support surface 、 Optics 、 Wavelength 、 Surface (mathematics) 、 Materials science
摘要: A method and device for determining surface structure subsurface structures wherein the article to be examined is placed upon a support through liquid or solid medium ultrasonic waves are directed at backscattered received processed. The frequency of selected provide information depth substantially one wavelength.