Sweeping photoreflectance spectroscopy of semiconductors
作者： H. Shen , M. Dutta
DOI: 10.1063/1.103606
关键词: Luminescence 、 Noise (electronics) 、 Laser pumping 、 Photoluminescence 、 Beam (structure) 、 Chopper 、 Spectroscopy 、 Semiconductor 、 Optics 、 Chemistry
摘要: We report a new type of photoreflectance (PR) by means sweeping the pump laser beam. The modulation is achieved moving position beam with respect to probe In conventional (using mechanical chopper) problem caused photoluminescence (PL) produced light. This particularly acute at low temperatures where PL large. our novel (SPR) technique intensity constant. Hence associated luminescence eliminated. Therefore SPR spectra can be obtained much lower than PR. signal noise ratio in usually better that sources both and also discussed.
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