X-ray Spectroscopic Measurement of Photoelectron Inelastic Mean Free Paths in Molybdenum
作者： Christopher T. Chantler , Jay D. Bourke
DOI: 10.1021/JZ100776H
关键词: Electron energy loss spectroscopy 、 Electron diffraction 、 Spectroscopy 、 Chemistry 、 X-ray absorption fine structure 、 Inelastic mean free path 、 Absorption (electromagnetic radiation) 、 Inelastic scattering 、 Electron 、 Atomic physics
摘要: The electron inelastic mean free path (IMFP) of molybdenum is determined experimentally over an energy range 1-120 eV using analysis X-ray absorption fine structure (XAFS). This new approach enables accurate measurements IMFPs in this rangewheredirect areoften difficult and highly uncertain, provides a means for studying materials inaccessible through current alternate techniques. can also be used todeterminelocalizedIMFPswithincomplexmolecularsystems,enablingdetailed studyofsurfacesandnanoenvironments.This informationisimportantfordiverse applications physical chemistry including microscopy, spectroscopy, diffraction (low-energy (LEED) loss spectroscopy (EELS) particular). Here we reveal the accuracy achievable experimental data high statistical precision, critically evaluate form IMFP asymptotic region low limit. SECTION Electron Transport, Optical Electronic Devices, Hard Matter
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