作者: Lee Choo Tay , Weng Kin Lai , Kai Yuen Cheah , Sze Liu Gan
DOI: 10.1109/CSPA52141.2021.9377293
关键词: Contrast (vision) 、 Lighting system 、 Computer vision 、 Image processing 、 Blob detection 、 Arm surface 、 Computer science 、 Machine vision system 、 Artificial intelligence 、 Machine vision
摘要: The importance of optimum illumination has been undervalued in machine vision system over the years. Most research work emphasized on developing advanced and complex algorithms with little attention lighting design configurations. Using right configuration can significantly improve efficiency effectiveness an inspection system. This paper describes a novel that reduces complexity image processing algorithm wiper arm surface defect detection. increases contrast between flawless area defective captured. Thus, it facilitates more accurate, reliable productive time improved to 0.21 seconds per arm.