作者: P Manning
DOI: 10.1016/S0167-2738(96)00514-0
关键词: Chemistry 、 Inorganic chemistry 、 Yttria-stabilized zirconia 、 Electrolyte 、 Oxygen 、 Secondary ion mass spectrometry 、 Activation energy 、 Fast ion conductor 、 Oxygen transport 、 Oxide
摘要: Abstract Isotopic Exchange Depth Profiling (IEDP) using Secondary Ion Mass Spectrometry (SIMS) has been used to investigate oxygen self-diffusion and surface exchange reactions in the related fluorites, yttria stabilised zirconia (YSZ) gadolinia doped ceria (CGO). The nature of reaction between gas solid explored phase analysis technique. Both YSZ CGO samples showed a change activation energy process at approximately 700 °C. In both temperature regimes two materials show similar enthalpies for reaction. At temperatures below °C is that bulk diffusion within same sample (i.e. 1 eV 0.9 CGO). greater than marked increase was observed, whilst no discernible seen transport. observed be 2.3 °C, increased 3.3 eV.