作者: A.-M. Flank , P. Lagarde , J.-P. Itié , A. Polian , G. R. Hearne
DOI: 10.1103/PHYSREVB.77.224112
关键词: Synchrotron 、 Extended X-ray absorption fine structure 、 X-ray absorption fine structure 、 X-ray absorption spectroscopy 、 Materials science 、 Polyamorphism 、 Analytical chemistry
摘要: A.-M. Flank,1,* P. Lagarde,1 J.-P. Itie,1 A. Polian,2 and G. R. Hearne3 1SOLEIL Synchrotron, L’Orme des Merisiers, BP 48, F-91192 GIF/Yvette, France 2Physique Milieux Denses, IMPMC, CNRS, Universite Pierre et Marie Curie-Paris 6, 140 rue de Lourmel, 75015 Paris, 3School of Physics & DST-NRF CoE in Strong Materials, University the Witwatersrand, Johannesburg, South Africa Received 20 March 2008; revised manuscript received 12 May published 25 June 2008