Valence‐band discontinuities of wurtzite GaN, AlN, and InN heterojunctions measured by x‐ray photoemission spectroscopy

作者: G. Martin , A. Botchkarev , A. Rockett , H. Morkoç

DOI: 10.1063/1.116177

关键词: Photoemission spectroscopyBinding energyOptoelectronicsPiezoelectricityMaterials scienceCondensed matter physicsWurtzite crystal structureElectronic structureX-ray spectroscopyHeterojunctionSpectroscopy

摘要: The valence‐band discontinuities at various wurtzite GaN, AlN, and InN heterojunctions were measured by means of x‐ray photoemission spectroscopy. A significant forward–backward …

参考文章(1)
J. L. Shay, Sigurd Wagner, J. C. Phillips, Heterojunction band discontinuities Applied Physics Letters. ,vol. 28, pp. 31- 33 ,(1976) , 10.1063/1.88555