A Module for BiST of CMOS RF Receivers
作者： Kay Suenaga , Rodrigo Picos , Sebastià Bota , Miquel Roca , Eugeni Isern
DOI: 10.1007/S10836-007-5051-1
关键词: CMOS 、 Conversion gain 、 Test method 、 Electronic engineering 、 GSM 、 Engineering 、 Overhead (computing) 、 Point (geometry) 、 Built-in self-test 、 Test strategy
摘要: A module to perform a built-in self-test in CMOS RF receivers is presented. The associated with test strategy consisting of measuring the main performance parameters single building blocks individually. Circuitry overhead, however, kept low by using some as part set-up and reusing them. overhead has also been reduced replacing direct determination their estimation. methodology applied mixer first down conversion stage GSM receiver, estimating its gain, 1dB compression third-order interception points. Using output IF amplifier only testing point, rms errors estimation above mentioned are 1.5, 3.0 2.7%, respectively.
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