Ion Trapping and Cluster Growth

作者: A. Veen

DOI: 10.1007/978-94-009-4422-0_12

关键词: IonIon trappingFrenkel defectIrradiationAtomImpurityTrappingMaterials scienceChemical physicsFluence

摘要: During irradiation of a solid surface with energetic ions the fate an implanted ion is determined 1. by its location in lattice, 2. defect concentration around atom, and 3. mobility atom either thermally activated migration interaction other mobile defects. At low fluence not influenced interactions collision cascades caused nor defects emerging from these cascades. The acts as dominant sink for increasingly higher fluences effects interference between products succesive become visible. Non-linearity growth populations then observed, sometimes including clustering atoms. Trapping processes early stages cluster development are discussed He, noble gas atoms, light impurities H N, metallic metals.

参考文章(53)
Kurt Schroeder, Theory of diffusion controlled reactions of point defects in metals Springer, Berlin, Heidelberg. pp. 171- 262 ,(1980) , 10.1007/BFB0043425
W. D. Wilson, R. A. Johnson, Rare Gases in Metals Springer, Boston, MA. pp. 375- 390 ,(1972) , 10.1007/978-1-4684-1992-4_18
Arthur S. Nowick, James Joseph Burton, Diffusion in Solids: Recent Developments ,(1975)
E. V. Kornelsen, A. A. van Gorkum, Attachment of mobile particles to non-saturable traps Radiation Effects and Defects in Solids. ,vol. 42, pp. 113- 124 ,(1979) , 10.1080/10420157908201742
A van Veen, A Warnaar, LM Caspers, Clustering of krypton in tungsten observed by helium desorption spectrometry Vacuum. ,vol. 30, pp. 109- 115 ,(1980) , 10.1016/S0042-207X(80)80058-3
W. D. Wilson, C. L. Bisson, Inert Gases in Solids: Interatomic Potentials and Their Influence on Rare-Gas Mobility Physical Review B. ,vol. 3, pp. 3984- 3992 ,(1971) , 10.1103/PHYSREVB.3.3984
A. van Veen, W.Th.M. Buters, G.J. van der Kolk, L.M. Caspers, T.R. Armstrong, Argon defect complexes in low energy Ar irradiated molybdenum Nuclear Instruments and Methods in Physics Research. ,vol. 194, pp. 485- 489 ,(1982) , 10.1016/0029-554X(82)90569-9