A survey of on-chip monitors
作者： S. Rahimipour , W.N. Flayyih , I. El-Azhary , S. Shafie , F.Z. Rokhani
DOI: 10.1109/ICCIRCUITSANDSYSTEMS.2012.6408286
关键词: Embedded system 、 Power (physics) 、 Single chip 、 Debugging 、 System validation 、 Voltage 、 Soft error 、 System on a chip 、 Reliability (semiconductor) 、 Engineering
摘要: … Any changes in critical path delay can be used to characterized the different type of variations such as process variation, supply noise effects, clock instability and aging effects. To …
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