作者: John G. Rohrbaugh , Jeffrey R. Rearick
DOI:
关键词: Integrated circuit 、 Electronic engineering 、 Electrical engineering 、 Automatic test equipment 、 Computer science
摘要: Methods for testing integrated circuits (ICs) are provided. An exemplary method, in which the IC has a first pad configured as signal interface components external to IC, having receiver receive an input from component comprises: electrically interconnecting automated test equipment (ATE) with IC; providing at least one stimulus such that measures termination characteristic of pad; and receiving information corresponding pad. Systems also