Method of Characterizing Hologram-Recording Materials*

摘要: A new method of characterizing hologram-recording materials is presented. This applicable to all types holograms. An ideal material permits the reconstruction a wave front linearly proportional original subject front. Based on this concept linear reconstruction, can be characterized by properties holograms recorded in with two interfering plane waves. If η hologram diffraction efficiency, E0 average exposure, and V visibility interference fringes, shown relation √η = SE0V, where S constant. For material, curves vs constant as parameter are families straight lines. Since η, E0, measurable quantities, similar also plotted for any real material. However, these lines only within limited ranges V. Within ranges, may considered ideal. Besides indicating linearity, set √η−E0 or √η−V particular indicates explicitly maximum optimum exposure value, holographic sensitivity characteristics some common shown, compared.