Novel thermal management and its analysis in GaN electronics
作者： Martin Kuball , Julian Anaya Calvo , James W. Pomeroy , Roland B. Simon
DOI:
关键词: Power electronics 、 Safe operating area 、 Electronics 、 Electronic engineering 、 Reliability (semiconductor) 、 Thermal 、 Communication channel 、 Diamond 、 Materials science 、 Heat transfer
摘要: GaN in microwave and power electronics enables performances of systems their safe operating area to be driven 'extremes'. When this challenge is taken up, thermal management one the major issues addressed. This includes heat transfer limitations across interfaces, however also potential incorporating novel materials such as diamond bulk into improve device reliability. Thermal parameters these implications on channel temperature devices are at present often not well known. Our latest results field presented.
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