Method and apparatus for the testing of dielectric materials

作者: Clarence D. Lunden

DOI:

关键词: Printed circuit boardDielectricGroup delay and phase delayAmplitudeNondestructive testingMicrowaveMaterials scienceOpticsPlane (geometry)Measure (physics)

摘要: Method and apparatus for the nondestructive testing of metal-clad microwave circuit boards to determine dielectric constant variations within sheets such boards. The method involves using injected energy measure values related average along a plurality paths in plane sheet. are divided into two intersecting groups, with each path being parallel members its own group. Resulting then compared order identify Measurements may be made by means phase delay or amplitude/resonance frequency techniques. A preferred measurement is disclosed which includes making simultaneous reference air path.