Photoluminescence study of ZnO varistor stability
作者： M. S. Ramanachalam , A. Rohatgi , W. B. Carter , J. P. Schaffer , T. K. Gupta
DOI: 10.1007/BF02659707
关键词: Grain boundary 、 Annealing (metallurgy) 、 Analytical chemistry 、 Positron annihilation spectroscopy 、 Mineralogy 、 Luminescence 、 Binary compound 、 Materials science 、 Deep-level transient spectroscopy 、 Photoluminescence 、 Varistor
摘要: Photoluminescence (PL) measurements were carried out on commercial ZnO varistor samples that electrically stressed and/or annealed at different temperatures. Changes in the intensity of green and yellow luminescence centers studied as a function annealing treatment. It was found (green yellow) decrease with increase temperature, reach minimum 700°C, again beyond 800°C. Furthermore, these bands observed PL spectra are quenched samples, compared to pure ZnO. In an sample, be higher as-sintered sample. Annealing sample resulted intensity. These observations consistent previous deep level transient spectroscopy doppler positron annihilation results. All experimental results ion migration model degradation can explained using grain boundary defect model.
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sci-hub.se 参考文章(20)
Kazuo Eda, Atsushi Iga, Michio Matsuoka, Degradation mechanism of non-Ohmic zinc oxide ceramics Journal of Applied Physics. ,vol. 51, pp. 2678- 2684 ,(1980) , 10.1063/1.327927
A. Rohatgi, S. K. Pang, T. K. Gupta, W. D. Straub, The deep level transient spectroscopy studies of a ZnO varistor as a function of annealing Journal of Applied Physics. ,vol. 63, pp. 5375- 5379 ,(1988) , 10.1063/1.340355
J. A. Garcia, A. Rem�n, J. Piqueras, Photoluminescence from electron irradiated ZnO Applied Physics A Solids and Surfaces. ,vol. 42, pp. 297- 299 ,(1987) , 10.1007/BF00616566
N. Riehl, Intrinsic defects and luminescence in II–VI-compounds Journal of Luminescence. pp. 335- 342 ,(1981) , 10.1016/0022-2313(81)90285-4
T. K. Gupta, W. G. Carlson, P. L. Hower, Current instability phenomena in ZnO varistors under a continuous ac stress Journal of Applied Physics. ,vol. 52, pp. 4104- 4111 ,(1981) , 10.1063/1.329262
G. D. Mahan, Intrinsic defects in ZnO varistors Journal of Applied Physics. ,vol. 54, pp. 3825- 3832 ,(1983) , 10.1063/1.332607
M. S. Ramanachalam, A. Rohatgi, J. P. Schaffer, T. K. Gupta, Characterization of ZnO varistor degradation using lifetime positron‐annihilation spectroscopy Journal of Applied Physics. ,vol. 69, pp. 8380- 8386 ,(1991) , 10.1063/1.347402
E. G. Bylander, Surface effects on the low‐energy cathodoluminescence of zinc oxide Journal of Applied Physics. ,vol. 49, pp. 1188- 1195 ,(1978) , 10.1063/1.325059
Ken Sato, Yoshio Takada, Hiroshi Maekawa, Masafumi Ototake, Shotaro Tominaga, Electrical Conduction of ZnO Varistors under Continuous DC Stress Japanese Journal of Applied Physics. ,vol. 19, pp. 909- 917 ,(1980) , 10.1143/JJAP.19.909
T. K. Gupta, W. G. Carlson, Barrier voltage and its effect on stability of ZnO varistor Journal of Applied Physics. ,vol. 53, pp. 7401- 7409 ,(1982) , 10.1063/1.330109