On the measure of dislocation densities from diffraction line profiles: A comparison with discrete dislocation methods

摘要: Abstract In this work the accuracy and range of applicability peak broadening models, from which dislocation densities can be extracted, is studied. For that purpose microstructures are generated via a discrete dynamics method internal elastic strains within simulated volume calculated. Diffraction peaks simulations whole pattern line profile analysis based on Wilkens model used to quantify associated with microstructures. The applied case face-centered cubic crystals deforming in coplanar slip. analytical models quantified by considering realistic three-dimensional containing curved dislocations specified distribution. dependence sensitivity upon density long-range order investigated. It was found that, provided distribution rather homogeneous, provides fairly accurate predictions density.