Automated Josephson integrated circuit test system
作者： C.J. Burroughs , C.A. Hamilton
DOI: 10.1109/77.233980
关键词: Noise suppression 、 Integrated circuit 、 Josephson effect 、 Voltage 、 Communication channel 、 Electronic engineering 、 Ground loop (electricity) 、 Test equipment 、 Computer science 、 Automatic test equipment
摘要: An automated test system for complex superconductive integrated circuits has been developed. Its low-speed capability consists of 96 identical input/output (I/O) channels controlled by a PC-486 computer. Each channel is capable driving currents and reading voltages at frequencies up to 40 kHz. Integrating this I/O with high-speed equipment over the IEEE bus allows measurements limits equipment. The can automatically set biases, display I-V curves, measure parameter margins, plot threshold extract experimental circuit values, collect statistical data on spreads error rates. Issues noise suppression, ground loop handling, autocalibration are discussed. >
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