作者: Yong Eui Lee , David P. Norton , John D. Budai , Philip D. Rack , Michael D. Potter
DOI: 10.1063/1.127083
关键词: Epitaxy 、 Cathodoluminescence 、 Thin film 、 Photoluminescence 、 Analytical chemistry 、 Mineralogy 、 Crystallinity 、 Orthorhombic crystal system 、 Sapphire 、 Single crystal
摘要: Orthorhombic epitaxial Sr2CeO4 thin-film phosphors were grown on (100) SrTiO3 and yttria-stabilized-zirconia (YSZ) single crystal substrates with relationships of [010]Sr2CeO4//(100)[010]SrTiO3 (100)[010]Sr2CeO4//(100)[011]YSZ, respectively. As-deposited films exhibit a broadband photoluminescence (PL) emission, peaking at about 477–481 nm maximum cathodoluminescence (CL) intensity 465 nm. Enhanced PL was observed for the deposited YSZ as compared to deposits c-plane sapphire substrates, correlating improved intragranular crystallinity reducing defects via epitaxy. Postannealing in air significantly enhanced both CL intensities. Luminous efficiency 0.14 lm/W 1 kV 22 μA/cm2 2-μm-thick film annealed 1000 °C air.