Visualization of second-order nonlinear layer in thermally poled fused silica glass
作者： Honglin An , Simon Fleming , Guy Cox
DOI: 10.1063/1.1835554
关键词: Layer (electronics) 、 Composite material 、 Silica glass 、 Microscopy 、 Poling 、 Anode 、 Materials science 、 Nonlinear optics 、 Nonlinear system 、 Glass Poling 、 Optics 、 Physics and Astronomy (miscellaneous)
摘要: Second-harmonic microscopy has been applied to characterize the second-order nonlinear layer in fused silica plates thermally poled at 280 °C and 3.5 kV for different time intervals. The is found only under anode surface be ∼5μm deep a poling of 30 min. Progression this into bulk glass with also characterized.
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