作者: Ille C. Gebeshuber , Richard A. P. Smith , Hannspeter Winter , Friedrich Aumayr
关键词: Microscopy 、 Scanning ion-conductance microscopy 、 Magnetic force microscope 、 Chemistry 、 Scanning probe microscopy 、 Nanoscopic scale 、 Magnetic resonance force microscopy 、 Magnetic resonance microscopy 、 Scanning confocal electron microscopy 、 Nanotechnology
摘要: Scanning probe microscopy offers interesting approaches to not only image but also manipulate samples in the micro- and nanoscale regime.