SCANNING PROBE MICROSCOPY ACROSS DIMENSIONS

作者: Ille C. Gebeshuber , Richard A. P. Smith , Hannspeter Winter , Friedrich Aumayr

DOI: 10.1007/1-4020-3616-7_8

关键词: MicroscopyScanning ion-conductance microscopyMagnetic force microscopeChemistryScanning probe microscopyNanoscopic scaleMagnetic resonance force microscopyMagnetic resonance microscopyScanning confocal electron microscopyNanotechnology

摘要: Scanning probe microscopy offers interesting approaches to not only image but also manipulate samples in the micro- and nanoscale regime.

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