A high-resolution transmission electron microscopy investigation of the interfacial structure of CoNiCr/Cr bi-layer magnetic thin films
作者： B. Y. Wong , D. E. Laughlin
DOI: 10.1017/S0424820100088117
关键词: Optoelectronics 、 Resolution (electron density) 、 Materials science 、 Transmission electron microscopy 、 Thin film 、 Bi layer
摘要:
sci-hub.st 参考文章(2)
K. Hono, B. Wong, D. E. Laughlin, Crystallography of Co/Cr bilayer magnetic thin films Journal of Applied Physics. ,vol. 68, pp. 4734- 4740 ,(1990) , 10.1063/1.346155
J. Lazzari, I. Melnick, D. Randet, Thin evaporated films with high coercive force IEEE Transactions on Magnetics. ,vol. 3, pp. 205- 207 ,(1967) , 10.1109/TMAG.1967.1066051