作者: Ch Köpf , H Kosina , S Selberherr
DOI: 10.1016/S0038-1101(97)00051-8
关键词: Electron mobility 、 Critical thickness 、 Residual strain 、 Monte Carlo method 、 Electronic band structure 、 Anisotropy 、 Condensed matter physics 、 Effective mass (solid-state physics) 、 Physical model 、 Materials science
摘要: Abstract We describe models for physical properties of the technologically significant GaInAs material system with respect to its composition and strain conditions introduced by strained-layer heteroepitaxy. give an empirical relation critical thickness which takes growth into account allows residual layer thicknesses exceeding one be estimated. Easy use band edge energy effective mass are presented, based on deformation potential k·p theory. Monte Carlo calculations were employed obtain a model anisotropic electron mobility. All given as functions independent parameters no longer strictly coupled in relaxed case.