Near-field heat transfer in a scanning thermal microscope.
作者： Achim Kittel , Wolfgang Müller-Hirsch , Jürgen Parisi , Svend-Age Biehs , Daniel Reddig
DOI: 10.1103/PHYSREVLETT.95.224301
关键词: Heat transfer 、 Near and far field 、 Scanning electron microscope 、 Thermal 、 Length scale 、 Thermal radiation 、 Physics 、 Dielectric 、 Computational physics 、 Microscope 、 Optics
摘要: We present measurements of the near-field heat transfer between tip a thermal profiler and planar material surfaces under ultrahigh vacuum conditions. For tip-sample distances below 10-8 m, our results differ markedly from prediction fluctuating electrodynamics. argue that these differences are due to existence material-dependent small length scale which macroscopic description dielectric properties fails, discuss heuristic model yields fair agreement with available data. These importance for quantitative interpretation signals obtained by scanning microscopes capable detecting local temperature variations on surfaces.
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