Measurement of the piezoelectric and electrooptic constants of GaPO4 with a michelson interferometer

摘要: Abstract A new measurement system to determine the piezoelectric and electrooptic constants of gallium orthophosphate (GaPO4) by inverse effect was developed. The change in length due applied voltage is measured with a Michelson interferometer. With this method are determined without knowledge any other material constant wide temperature range. dependence longitudinal piezo (d11 = 4.5 pm/V) from room up 550°C very low. Therefore good choice for applications high environment.