作者: Marie Lucas , Jean-François Boily
DOI: 10.1021/ACS.LANGMUIR.5B03849
关键词: Conductivity 、 Charge carrier 、 Hematite 、 Double-layer capacitance 、 Chemistry 、 Microelectrode 、 Analytical chemistry 、 Scanning electrochemical microscopy 、 Electrical impedance 、 Nanotechnology 、 Single crystal
摘要: Alternating current scanning electrochemical microscopy (AC-SECM) was used for the first time to map key attributes of oriented hematite (α-Fe2O3) single crystal surfaces at micron-scale. Localized impedance spectra (LEIS) (001) and (012) faces provided insight into spatial variations local double layer capacitance (Cdl) charge transfer resistance (Rad). These parameters were extracted by LEIS measurements in 0.4–8000 Hz range probe response generated redistribution water molecules carriers (ions) under an applied AC. attributed conductivity sample surfaces. Comparison with global EIS on same samples uncovered highly comparable frequency-resolved processes, that broken down contributions from bulk hematite, interface as well microelectrode/tip assembly. This work paves way new studies aimed mapping electroche...