Shape Memory Effect and Pseudoelasticity in Cu Nanowires

摘要: We report the discovery of a novel pseudoelastic behavior in single-crystalline Cu nanowires through atomistic simulations. Under tensile loading and unloading, are capable recovering elongations up to 51%, well beyond typical recoverable strains 5–8% for most bulk shape memory alloys (SMAs). This phenomenon is associated with reversible crystallographic lattice reorientation driven by high surface-stress-induced internal stresses due surface-to-volume ratios at nanoscale. The temperature-dependence this leads effect (SME). well-defined wires between 1.76 3.39 nm size over temperature range 100–900 K.