Additive Nano-Lithography with Focused Soft X-rays: Basics, Challenges, and Opportunities

作者: Andreas Späth

DOI: 10.3390/MI10120834

关键词: MicroscopyNano-NanotechnologyMaterials scienceMicroscopeCathode rayX-ray lithographyLithographyDeposition (phase transition)Nanolithography

摘要: … small for low excitation doses due to reduction of the interaction volume [97,98]. The amount of deposited material exhibits direct linear dependence with the dwell time and the supplied …

参考文章(122)
Adam P. Hitchcock, Soft X-ray spectromicroscopy and ptychography Journal of Electron Spectroscopy and Related Phenomena. ,vol. 200, pp. 49- 63 ,(2015) , 10.1016/J.ELSPEC.2015.05.013
Milos Toth, Charlene Lobo, Vinzenz Friedli, Aleksandra Szkudlarek, Ivo Utke, Continuum models of focused electron beam induced processing. Beilstein Journal of Nanotechnology. ,vol. 6, pp. 1518- 1540 ,(2015) , 10.3762/BJNANO.6.157
S Fakra, ALD Kilcoyne, Tolek Tyliszczak, Scintillator Detectors for Scanning Transmission X-ray Microscopes at the Advanced Light Source AIP Conference Proceedings. ,vol. 705, pp. 973- 976 ,(2004) , 10.1063/1.1757959
Rachel M Thorman, Ragesh Kumar T. P., D Howard Fairbrother, Oddur Ingólfsson, The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors. Beilstein Journal of Nanotechnology. ,vol. 6, pp. 1904- 1926 ,(2015) , 10.3762/BJNANO.6.194
A.M. Maiden, G.R. Morrison, B. Kaulich, A. Gianoncelli, J.M. Rodenburg, Soft X-ray spectromicroscopy using ptychography with randomly phased illumination Nature Communications. ,vol. 4, pp. 1669- ,(2013) , 10.1038/NCOMMS2640
Andrew J. Atkins, Christoph R. Jacob, Matthias Bauer, Probing the electronic structure of substituted ferrocenes with high-resolution XANES spectroscopy. Chemistry: A European Journal. ,vol. 18, pp. 7021- 7025 ,(2012) , 10.1002/CHEM.201200649
M.J. Simpson, A.G. Michette, Imaging Properties of Modified Fresnel Zone Plates Journal of Modern Optics. ,vol. 31, pp. 403- 413 ,(1984) , 10.1080/713821522
W. F. van Dorp, Sub-10 nm writing: focused electron beam-induced deposition in perspective Applied Physics A. ,vol. 117, pp. 1615- 1622 ,(2014) , 10.1007/S00339-014-8588-8
A. L. D. Kilcoyne, T. Tyliszczak, W. F. Steele, S. Fakra, P. Hitchcock, K. Franck, E. Anderson, B. Harteneck, E. G. Rightor, G. E. Mitchell, A. P. Hitchcock, L. Yang, T. Warwick, H. Ade, Interferometer‐controlled scanning transmission X‐ray microscopes at the Advanced Light Source Journal of Synchrotron Radiation. ,vol. 10, pp. 125- 136 ,(2003) , 10.1107/S0909049502017739
A. Braun, A. Kubatova, S. Wirick, S.B. Mun, Radiation damage from EELS and NEXAFS in diesel soot and diesel soot extracts Journal of Electron Spectroscopy and Related Phenomena. ,vol. 170, pp. 42- 48 ,(2009) , 10.1016/J.ELSPEC.2007.08.002