作者: Andrea M. Armani , Yuji Zhao , Kai Fu , Chee Wei Wong , Houqiang Fu
DOI:
关键词: Octave (electronics) 、 Wavelength 、 Metrology 、 Infrared 、 Supercontinuum 、 Soliton (optics) 、 Optoelectronics 、 Dispersion (optics) 、 Second-harmonic generation
摘要: On-chip ultraviolet to infrared (UV-IR) spectrum frequency metrology is of crucial importance as a characterization tool for fundamental studies on quantum physics, chemistry, and …