Atomic force microscopy and x-ray diffraction studies on agglomeration phenomena of ultrathin Au/Fe bilayers
作者： Masao Kamiko , Jung-Woo Koo , Jae-Min Kim , Jae-Geun Ha
DOI: 10.1116/1.4705518
关键词: Materials science 、 Crystallography 、 Thin film 、 Chemical engineering 、 Substrate (electronics) 、 Layer (electronics) 、 Nanometre 、 Sputter deposition 、 Surface energy 、 Bilayer 、 X-ray crystallography
摘要: The agglomeration phenomena of a few nanometer thick Au/Fe bilayers, grown on an MgO(100) substrate, were studied by using atomic force microscopy and x ray diffraction (XRD). authors found that the insertion Fe ultrathin layer between substrate 4 nm Au promotes process layer, in which bilayer structure changes into large Fe/Au islands ∼200 diameter. In addition, XRD results revealed agglomerated has only (111)-crystallographic orientation, presumably caused reducing surface energy MgO(001) substrate. These findings are quite different from cases structural stabilization is achieved inserting seeding nanometers
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