The investigation of engineering materials using atom-probe techniques
作者： Brian Ralph , S.A. Hill , M.J. Southon , M.P. Thomas , A.R. Waugh
DOI: 10.1016/0304-3991(82)90254-6
关键词: Nanotechnology 、 Atom probe 、 Materials science 、 Microstructure 、 Field ion microscope
摘要: Abstract A brief review of atom-probe instruments and their applications is given. The development the from field ion microscope mentioned, as are some important microscopy. unique advantages illustrated by reference to recent studies surface phenomena bulk microstructures.
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