作者: Lorenzo Mancini , Florian Moyon , David Hernàndez-Maldonado , Ivan Blum , Jonathan Houard
DOI: 10.1021/ACS.NANOLETT.7B01189
关键词: Quantum dot 、 Epitaxy 、 Focused ion beam 、 Scanning transmission electron microscopy 、 Electron tomography 、 Field electron emission 、 Materials science 、 Molecular physics 、 Atom probe 、 Analytical chemistry 、 Characterization (materials science)
摘要: The localization of carrier states in GaN/AlN self-assembled quantum dots (QDs) is studied by correlative multimicroscopy relying on microphotoluminescence, electron tomography, and atom probe tomography (APT). Optically active field emission tip specimens were prepared focused ion beam from an epitaxial film containing a stack dot layers analyzed with different techniques applied subsequently the same tip. transition energies single QDs calculated framework 6-bands k.p model basis APT scanning transmission microscopy characterization showing that good agreement between experimental can be obtained, overcoming limitations both techniques. results indicate holes effectively localize at interface fluctuations bottom QD, decreasing extent wave function band-to-band energy. They also represent important step toward correlation three-dimensional...