作者: M.K. Zayed , M.S. Hegazy , H.E. Elsayed-Ali
DOI: 10.1016/J.TSF.2003.10.155
关键词: Indium 、 Composite material 、 Atmospheric temperature range 、 Supercooling 、 Materials science 、 Scanning electron microscope 、 Crystallography 、 Melting point 、 Electron diffraction 、 Reflection high-energy electron diffraction 、 Melting-point depression
摘要: Melting and solidification of indium nanocrystals grown on (002) highly oriented graphite is studied by reflection high-energy electron diffraction operating in a transmission mode through the outer shell nanocrystals. When recrystallized from melt, evaporated grows as an ensemble with particle size distribution that depends mean film thickness. Films thickness 0.5 to 34 ML are investigated. The intensity change pattern temperature used probe melting starts at temperatures below bulk temperature, depending continues over range extending up melting. liquid skin model homogenous shown agree point dependence. However, line profile analysis shows reduction crystalline volume within probed high temperatures. This indicates formation layer surrounding supports model. All films show supercooling amount increases 6 remains constant for larger