作者: Nik Rajic , Neil Street
DOI: 10.1080/17686733.2014.962835
关键词: Stress (mechanics) 、 Detector 、 Sensitivity (electronics) 、 Microbolometer 、 Noise-equivalent temperature 、 Infrared 、 Thermoelastic damping 、 Indium antimonide 、 Materials science 、 Optics
摘要: This study compares the stress-measurement sensitivity of several commercially available vanadium-oxide microbolometers to a scientific grade cooled indium antimonide imager. The devices were tested under similar conditions on same mechanically-loaded subjects; one uniaxially loaded plate containing circular hole and other representative aircraft wing-skin coupon. are shown consistently outperform imager for scan durations 1500 load cycles or more despite having noise equivalent temperature detectivities (NETD) that inferior by factors between approximately 2 6. finding is significant in two respects: it suggests an NETD specification has only limited value as metric thermoelastic stress analysis secondly confirms able furnish high-fidelity measurements type traditionally associated with infrared imagers which generally costly acquire cumbers...