A performance comparison between cooled and uncooled infrared detectors for thermoelastic stress analysis

作者: Nik Rajic , Neil Street

DOI: 10.1080/17686733.2014.962835

关键词: Stress (mechanics)DetectorSensitivity (electronics)MicrobolometerNoise-equivalent temperatureInfraredThermoelastic dampingIndium antimonideMaterials scienceOptics

摘要: This study compares the stress-measurement sensitivity of several commercially available vanadium-oxide microbolometers to a scientific grade cooled indium antimonide imager. The devices were tested under similar conditions on same mechanically-loaded subjects; one uniaxially loaded plate containing circular hole and other representative aircraft wing-skin coupon. are shown consistently outperform imager for scan durations 1500 load cycles or more despite having noise equivalent temperature detectivities (NETD) that inferior by factors between approximately 2 6. finding is significant in two respects: it suggests an NETD specification has only limited value as metric thermoelastic stress analysis secondly confirms able furnish high-fidelity measurements type traditionally associated with infrared imagers which generally costly acquire cumbers...

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