作者: S. Y. Suh , D. A. Snyder , D. L. Anderson , H. G. Craighead
DOI: 10.1364/AO.23.003956
关键词: Waveform 、 Materials science 、 Signal 、 Optics 、 Optical recording 、 Signal-to-noise ratio 、 Thin film 、 Laser power scaling 、 Optical storage 、 Fourier transform
摘要: Statistical analysis of the read-out signal waveforms revealed that expected bit error rates or SNRs textured media are comparable to those Te-based ablative recording media. The edge definition written bits in was significantly better than obtained from Te thin film media, while peak height fluctuations somewhat greater films. Dynamic noise measurements were made on unprotected and aged germanium Carrier-to-noise ratios calculated by digital Fourier transform (50-kHz BW) 41 43 dB for respectively. Because simple melting limited optical writing it possible obtain analytically contrast as a function laser power. experimental data agree well with contrast. This allows great deal simplification optimization SNR performance