Apparatus, System, and Method for Increasing Measurement Accuracy in a Particle Imaging Device

作者: Wayne Dennis Roth , Matthew S. Fisher

DOI:

关键词: Accuracy and precisionIntensity (heat transfer)PhysicsParticle imagingOpticsParticleMeasure (physics)Light detector

摘要: An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure emitted by first particle second particle, where the measured from at least partially overlaps an overlap region. Additionally, processor coupled detector, is determine contribution of region also be subtract intensity particle.

参考文章(37)
Robert Ivan McConnell, Stephen Peter Fitzgerald, John Victor Lamont, Method and apparatus for analyzing an image ,(1998)
Gilmore J. Sem, Jugal K. Agarwal, Peter P. Hairston, Frank D. Dorman, Apparatus for measuring particle sizes and velocities ,(1994)
Terry L. McCutcheon, James M. Reuben, Laser scanning cytology with digital image capture ,(2001)
Michael J. Rust, Xiaowei Zhuang, Wilfred Mark Bates, Sub-diffraction limit image resolution and other imaging techniques ,(2007)