XPS study on the surface films of a newly designed Ni-free Ti-based bulk metallic glass
作者： C.L. Qin , J.J. Oak , N. Ohtsu , K. Asami , A. Inoue
DOI: 10.1016/J.ACTAMAT.2006.10.054
关键词: Surface film 、 Electrochemistry 、 X-ray photoelectron spectroscopy 、 Surface layer 、 Corrosion 、 Composite material 、 Immersion (virtual reality) 、 Materials science 、 Alloy 、 Amorphous metal 、 Metallurgy
摘要: Abstract The electrochemical and corrosion behavior of a newly designed Ni-free Ti-based bulk metallic glass (BMG) was investigated. Ti45Zr10Pd10Cu31Sn4 BMG exhibits excellent resistance after immersion in 3 mass% NaCl, 1 N H2SO4 H2SO4 + 0.01 N NaCl solutions. X-ray photoelectron spectroscopy measurements were used to analyze the changes elements on alloy surface before various formation Ti- Zr-enriched highly protective thin films is responsible for high this corrosive
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