作者: S.P. Watkins , U.O. Ziemelis , M.L.W. Thewalt , R.R. Parsons
DOI: 10.1016/0038-1098(82)90772-4
关键词: Copper 、 Silicon 、 Luminescence 、 Atomic physics 、 Doping 、 Phonon 、 Exciton 、 Photoluminescence 、 Spectral line 、 Materials science
摘要: Abstract Intense, long lived photoluminescence lines with a complex local mode phonon structure are reported in copper-doped silicon. The spectra and luminescence decay times both studied as function of sample temperature. We interpret all these arising from the recombination excitons bound to single type copper-related isoelectronic defect.