Scanning electron microscope‐cathodoluminescence (SEM‐CL) imaging of planar deformation features and tectonic deformation lamellae in quartz

摘要: Abstract– Planar deformation features (PDFs) in quartz are essential proof for the correct identification of meteorite impact structures and related ejecta layers, but can be confused with tectonic lamellae. The only completely reliable method to demonstrate shock origin suspected (sub-) planar microstructures, transmission electron microscope (TEM) observations, is costly time consuming. We have used a cathodoluminescence (CL) detector attached scanning (SEM) image both PDFs lamellae potential simple identify define characteristics that allow their distinction from In limited wavelength grayscale composite color SEM-CL images, easily identified. They straight, narrow, well-defined features, whereas thicker, slightly curved, there often no clear boundary between lamella host quartz. Composite images reveal two types CL behavior PDFs: either they emit red infrared signal or nonluminescent. emitted by ranges blue red. For comparison, we also imaged several shocked grains at cryogenic temperature. most cases, PDF cryo-CL do not differ significantly those recorded room conclude imaging, especially when composites used, provides promising, practical, low cost, nondestructive distinguish lamellae, even simplest techniques available used.