作者: Kota Sakamoto , Fumio Hayashi , Kazuyoshi Sato , Mitsuhiro Hirano , Naofumi Ohtsu
DOI: 10.1016/J.APSUSC.2020.146729
关键词: Atomic ratio 、 Calibration curve 、 X-ray photoelectron spectroscopy 、 Spectral line 、 Materials science 、 Analytical chemistry 、 Non-blocking I/O 、 Alloy 、 Principal component analysis 、 Oxide 、 Surfaces, Coatings and Films
摘要: … , the XPS analysis for multiple oxides comprising NiO, TiO 2 … XPS spectra for multiple oxides containing NiO, TiO 2 , and NiTiO 3 states. First, the binding energies and shapes of the XPS …