作者: Enrico Traversa , Maria Luisa Di Vona , Patrizia Nunziante , Silvia Licoccia , Jong Won Yoon
关键词: Nanocomposite 、 Analytical chemistry 、 Atomic ratio 、 Materials science 、 X-ray photoelectron spectroscopy 、 Titanium isopropoxide 、 Photoelectrochemistry 、 Chemical state 、 Thin film 、 Sol-gel
摘要: Ag-TiO2 thin films were prepared with a sol-gel route, using titanium isopropoxide and silver nitrate as precursors, at 0, 0.03 0.06 Ag/Ti nominal atomic ratios. After drying 80°C, the fired 300°C, 500°C, 600°C for 30 min 5 h. Glancing angle X-ray diffraction (XRD) analysis photoelectron spectroscopy (XPS), depth profiling of concentration, used to study films. XPS showed presence C N impurities in nanocomposite Their concentration decreased increasing firing temperature. Chemical state that Ag was present metallic state, except outer layer where it Ag+. For Agt/Ti 0.06, measurements film 300°C strong enrichment surface, while composition remained almost constant within rest film, ratio 0.02. Two layers found heated ratios 0.015 near surface substrate. The photoelectrochemical properties studied deposited on ITO substrates. Photocurrents electrodes observed even visible light, wavelengths longer than 400 nm.