The capacitance of bicrystal Josephson junctions deposited on SrTiO/sub 3/ substrates

作者: E.J. Tarte , G.A. Wagner , R.E. Somekh , F.J. Baudenbacher , P. Berghuis

DOI: 10.1109/77.622212

关键词: Relative permittivityGrain boundaryHysteresisHigh-temperature superconductivityJosephson effectDiffusion capacitanceCondensed matter physicsCapacitanceMaterials scienceSubstrate (electronics)

摘要: We have investigated the capacitance of grain boundary Josephson junctions deposited on symmetric 24/spl deg/ misoriented SrTiO/sub 3/ bicrystal substrates using hysteresis and Fiske resonances in their current voltage characteristics. Our measurements show that total junction is proportional to area. The per unit area (140/spl plusmn/30) fF /spl mu/m/sup -2/ this implies main effect large relative permittivity substrate scale-up by a factor around 10. also find planar geometry velocity light depends upon film thickness.

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